Thermal stability of thin‐film amorphous W‐Ru, W‐Re, and Ta‐Ir alloys
作者： A. W. Denier van der Gon , J. C. Barbour , R. de Reus , F. W. Saris
DOI: 10.1063/1.338171
关键词:
摘要: The crystallization behavior of self‐supporting thin‐film amorphous W‐Ru, W‐Re, and Ta‐Ir alloys has been studied with transmission electron microscopy. Crystallization temperatures have observed which are much lower than the predicted by a semiempirical model: highest 775 °C for W‐Ru W‐Re alloys, 900 °C alloys. All three systems show maximum thermal stability at composition expected using enthalpy considerations.
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