Optical Differential Reflectance Spectroscopy of Molecular Thin Films on a Metal: Evidence for Strong Oscillator Strength Increase
作者： Thomas Dienel , Roman Forker , Karl Leo , Torsten Fritz
DOI: 10.1021/JP075128I
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摘要: We investigate the thickness-dependent dielectric function of ultrathin titanyl phthalocyanine (TiOPc) layers on Au(111) by in situ spectroscopy during film growth. The absorption features reveal a complex structural development film, described observation different crystal phases. experiment allows addressing thickness dependence oscillator strength films for first time. Surprisingly, increases with more than factor 3 and does not saturate until 20 monolayers is reached.
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