Measurement system induced errors in diode thermometry

摘要: Diode temperature sensors are capable of being used at the accuracy level a few hundredths kelvin. However, in order to achieve this performance, proper measurement techniques must be used. Poorly shielded or improperly grounded systems can introduce ac noise which will create an apparent shift dc voltage reading across diode sensor. This results error may approach several tenths The presence question is not obvious during normal usage and quick tests outlined verify whether problem exists. Experimental data derivations from theoretical p‐n junction characteristics given correlate with possible voltage/temperature errors. These estimating performance system. Several more common problems into circuitry described.