Analytical transmission electron microscopy
作者： Wilfried Sigle
DOI: 10.1146/ANNUREV.MATSCI.35.102303.091623
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摘要: ▪ Abstract Chemical analysis at high spatial resolution is the domain of analytical transmission electron microscopy. Owing to rapid instrumental developments during past decade, energy-loss spectroscopy offers now a close 0.1 nm and an energy eV. This development has been accompanied by introduction numerous new techniques methods for data acquisition analysis, which are outlined in present article. Recent results wide range material systems addressed. These comprise first-principles calculations, have contributed enormous progress calculation near-edge fine structures, fingerprinting methods, still important interpretation experimental data.
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