Creation of [110]-aligned Si quantum wires encompassed by SiO2 using low-energy separation-by-implanted-oxygen on a V-groove patterned substrate

作者: Yukari Ishikawa , N. Shibata , S. Fukatsu

DOI: 10.1063/1.121427

关键词:

摘要: Si quantum wires (QWRs) suspended in SiO2 are successfully created on a V-groove patterned Si(001) substrate by using low-energy oxygen ion implantation. A single QWR aligned to [110] is formed near the bottom center of V groove, which has hexagonal cross section with {111} and {001} lateral facets. The development QWRs was found be controlled dose formation mechanism attributed an enrichment corner arises from straggling.

参考文章(13)
Kazuo Itoh, Kazuaki Iwameji, Yoshisato Sasaki, Fabrication of Thin Silicon Wires by Anisotropic Wet Etching of SOI Structures Japanese Journal of Applied Physics. ,vol. 30, pp. L1605- L1607 ,(1991) , 10.1143/JJAP.30.L1605
Yukari Ishikawa, N. Shibata, S. Fukatsu, Fabrication of highly oriented Si:SiO2 nanoparticles using low energy oxygen ion implantation during Si molecular beam epitaxy Applied Physics Letters. ,vol. 68, pp. 2249- 2251 ,(1996) , 10.1063/1.115874
U. Bussmann, A. K. Robinson, P. L. F. Hemment, G. J. Campisi, Silicon‐on‐insulator device islands formed by oxygen implantation through patterned masking layers Journal of Applied Physics. ,vol. 70, pp. 4584- 4592 ,(1991) , 10.1063/1.349095
Yukari Ishikawa, Noriyoshi Shibata, Susumu Fukatsu, Creation of Highly-Ordered Si Nanocrystal Dots Suspended in SiO2 by Molecular Beam Epitaxy with Low Energy Oxygen Implantation Japanese Journal of Applied Physics. ,vol. 36, pp. 4035- 4037 ,(1997) , 10.1143/JJAP.36.4035
D. Ali, H. Ahmed, Coulomb blockade in a silicon tunnel junction device Applied Physics Letters. ,vol. 64, pp. 2119- 2120 ,(1994) , 10.1063/1.111702
Yukari Ishikawa, Noriyoshi Shibata, Preparation of multilayered thin silicon‐on‐insulator structure by low‐energy oxygen ion implantation Applied Physics Letters. ,vol. 61, pp. 1543- 1545 ,(1992) , 10.1063/1.107490
H. Namatsu, Fabrication of sub-10-nm silicon lines with minimum fluctuation Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. ,vol. 13, pp. 1473- 1476 ,(1995) , 10.1116/1.588174
K. Izumi, M. Doken, H. Ariyoshi, C.M.O.S. devices fabricated on buried SiO2 layers formed by oxygen implantation into silicon Electronics Letters. ,vol. 14, pp. 593- 594 ,(1978) , 10.1049/EL:19780397