Method of measuring resistivity, and apparatus therefor

作者: Masato Yamashita , Yasusuke C , O Shinsozai Kenkyu Sho Yamaguchi , Hideto C , O Nihon Sumsonics Co. Ltd. Hashizume

DOI:

关键词:

摘要: A method and apparatus for measuring resistivity employing the four-point probe to measure surface or volume of a sample. The includes inputting sample shape information calculating resistance correction coefficient (F;FP) is calculated by multiplying value coefficient. an input unit (51) information, designating measurement position on sample, (50) coefficient, probe. (56) including four colinear electrodes (11,12,13,14), detecting (55) passing predetermined current through two outer (11,14) potential difference across inner (12,13), resistivity:

参考文章(16)
Edward F Gorey, Andrew Dupnock, William A Keenan, Method for measuring resistivity ,(1971)
Peter R. Bossard, Robert H. Dunphy, Surface resistivity meter ,(1985)
David Steven Perloff, Chester Mallory, Sandor Droblisch, Van Pham Hung, Apparatus and methods for semiconductor wafer testing ,(1986)
Richard Lewis Cohen, Kenneth William West, Precision nondestructive testing of metals ,(1984)
Leopoldo B. Valdes, Resistivity Measurements on Germanium for Transistors Proceedings of the IRE. ,vol. 42, pp. 420- 427 ,(1954) , 10.1109/JRPROC.1954.274680
F. M. Smits, Measurement of Sheet Resistivities with the Four-Point Probe Bell System Technical Journal. ,vol. 37, pp. 711- 718 ,(1958) , 10.1002/J.1538-7305.1958.TB03883.X