Structural properties of embedded Ge nanoparticles modified by swift heavy-ion irradiation

摘要: Silica-embedded Ge nanoparticles (NPs) of different sizes irradiated with swift heavy ions (SHIs) at a given energy may reportedly elongate along the incident ion direction, perpendicular to it, or not all. Here, for NP size distribution, we have investigated SHI dependence elongation process. Higher-energy irradiation generally yielded track (as previously observed), but lower-energy irradiation, both parallel and direction was observed. We demonstrate that electronic loss together govern process, reinforcing proposed model where is only expected NPs bigger than mean diameter in silica. wide fluence range also probed, enabling us follow more detail transition from spherical unirradiated elongated either beam. X-ray absorption spectroscopy (XAS) measurements are utilized quantification crystalline, amorphous, oxidized environments around atoms. Combining such results transmission electron microscopy (TEM) observations shows rendered amorphous prior elongation, potentially via melt-and-quench Thereafter, stronger electron-phonon coupling compared crystalline influence The amorphization occurs lower fluences higher energies, indicating loss-and ballistic effects-governs amorphization. Subsequent TEM XAS show gradually intermix SiO dissolve within matrix as increases. discuss impact beam tailoring technological applications.