Surface potential of ferroelectric thin films investigated by scanning probe microscopy
作者： X. Q. Chen , H. Yamada , T. Horiuchi , K. Matsushige , S. Watanabe
DOI: 10.1116/1.590851
关键词:
摘要: … the ferroelectric thin film were also acquired by modified SFM to detect the local orientation of the film … on thin films by electrostatic force microscopy, but they focused on nonferroelectric …
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