作者: A.J. Simons , T.I. Cox , M.J. Uren , P.D.J. Calcott
DOI: 10.1016/0040-6090(94)05622-K
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摘要: Current transport through porous silicon (PS) films of 50% porosity fabricated from n-type (0.018 Ω cm) substrates has been studied. This achieved by comparing the current density J vs. voltage V characteristics for metal/PS/n + -Si/aluminium and metal/PS/aluminium devices. For case metal=aluminium, J-V are ohmic. metal=gold, consistent with formation a rectifying Schottky barrier height 0.74 eV at Au/PS contact. As contact is forward biased positive bias on gold, this implies that PS n type in nature. confirmed Hall effect measurements which give carrier concentration mobility 1.3×10 13 cm -3 30 2 -1 s respectively. pinning Fermi level an energy approximately same as (-/0) P b centres SiO -Si interface