Darryl D. Restaino, Philip L. Flaitz, Yun-Yu Wang, Thomas M. Shaw, Lawrence A. Clevenger, Timothy Dalton, Derren N. Dunn, Stefanie R. Chiras, Chester T. Dziobkowski, James J. Demarest, Michael W. Lane, James R. Lloyd, Chih-Chao Yang,
Structure to improve adhesion between top CVD low-k dielectric and dielectric capping layer ,(2006)