作者: Yu Jin Park , Hyuk Nyun Kim , Hyun Ho Shin
DOI: 10.1016/J.APSUSC.2009.04.022
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摘要: Abstract The microstructural characterization of Ga-doped (5 at.%) ZnO thin film was conducted by a transmission electron microscopy study. atomic arrangement having an wurtzite structure identified the experimental HRTEM and Fourier filtered images as well diffractions. As result, we have revealed that orientation defect density films were greatly influenced deposition temperature, resulting in variation electrical property. In other words, tendency forming c -axis oriented texture grows up defects such dislocations stacking faults decrease, temperature sputtering increases. Consequently, properties can be controlled directly related with density.