Using the Adhesive Interaction between Atomic Force Microscopy Tips and Polymer Surfaces to Measure the Elastic Modulus of Compliant Samples

摘要: An atomic force microscope (AFM) method for measuring surface elasticity based on the adhesive interactions between an AFM tip and sample surfaces is introduced. The particularly useful when there a large adhesion soft samples, indentation would be less accurate. For thin this will have much interference from substrate than found using because only passive induced by tip-sample adhesion; in contrast, with sharp may break its stress-strain linearity, or even make it fracture. case where difficult to accurately locate contact point, which problematic method, helpful does not require locating point fitting whole retraction curve. model tested PDMS polymers different degrees of cross-linking.