作者: Su Yong Kwon , Yong-Gyoo Kim , Sanghyun Lee , Jong Chul Kim
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摘要: An apparatus for the evaluation of figure merit (ZT) thermoelectric devices has been developed and ZT values have estimated a device. The most challenging problem in value this was measuring thermal conductivity precisely. We solved by introducing primary measurement technique, guarded hot plate method, which makes it possible to obtain directly simultaneously four physical parameters related ZT, namely conductivity, electrical Seebeck coefficient, absolute temperature. performed single scan temperature difference between top bottom surfaces also addressed properties power generation efficiency commercial uncertainty assessed secure reliability found be 3.59%.