Reliability Characteristics of TANOS (TaN/AlO/SiN/Oxide/Si)NAND Flash Memory with Rounded Corner (RC) Structure
Sung-Il Chang , Chang-Hyun Lee , Changseok Kang , Sanghun Jeon
2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design 117 -118
8
2008
Excellent Resistive Switching Performance of Cu-Se-Based Atomic Switch Using Lanthanide Metal Nanolayer at the Cu-Se/Al2O3 Interface.
Hyunsuk Woo , Sujaya Kumar Vishwanath , Sanghun Jeon
ACS Applied Materials & Interfaces 10 ( 9) 8124 -8131
11
2018
Trap-limited and percolation conduction mechanisms in amorphous oxide semiconductor thin film transistors
Sungsik Lee , Khashayar Ghaffarzadeh , Arokia Nathan , John Robertson
Applied Physics Letters 98 ( 20) 203508
274
2011
Dislocation scatterings in p-type Si1−xGexunder weak electric field
Ji-Hyun Hur , Sanghun Jeon
Nanotechnology 26 ( 49) 495201 -495201
4
2015
Pulse I-V characterization of a nano-crystalline oxide device with sub-gap density of states.
Taeho Kim , Ji-Hyun Hur , Sanghun Jeon
Nanotechnology 27 ( 21) 215203 -215203
7
2016
Effect of hydrogen on dynamic charge transport in amorphous oxide thin film transistors.
Taeho Kim , Yunyong Nam , Ji-Hyun Hur , Sang-Hee Ko Park
Nanotechnology 27 ( 32) 325203 -325203
12
2016
Thin Ion-Gel Dielectric Layer to Enhance the Stability of Polymer Transistors
Sung Won Lee , Minkwan Shin , Jae Yoon Park , Bong Soo Kim
Science of Advanced Materials 7 ( 5) 874 -880
5
2015
45.3: Invited Paper: High Performance Nanocrystalline ZnOxNy for Imaging and Display Applications
Eunha Lee , Taeho Shin , Anass Benayad , HyungIk Lee
SID Symposium Digest of Technical Papers 46 ( 1) 681 -684
2015
Highly Manufacturable 32Gb Multi -- Level NAND Flash Memory with 0.0098 μm 2 Cell Size using TANOS(Si - Oxide - Al2O3 - TaN) Cell Technology
Youngwoo Park , Jungdal Choi , Changseok Kang , Changhyun Lee
international electron devices meeting 1 -4
63
2006
Temperature dependent electron transport in amorphous oxide semiconductor thin film transistors
Sungsik Lee , Arokia Nathan , John Robertson , Khashayar Ghaffarzadeh
international electron devices meeting
30
2011
How to achieve ultra high photoconductive gain for transparent oxide semiconductor image sensors
Sungsik Lee , Sanghun Jeon , John Robertson , Arokia Nathan
international electron devices meeting
8
2012
Oxide thin film transistor technology: Capturing device-circuit interactions
Arokia Nathan , Sungsik Lee , Sanghun Jeon , Reza Chaji
international electron devices meeting
1
2015
Transparent Oxide Semiconductors for Advanced Display Applications
Arokia Nathan , Sungsik Lee , Sanghun Jeon , Ihun Song
Information Display archive 29 ( 1) 6 -11
10
2013
Nanocrystalline ZnON; High mobility and low band gap semiconductor material for high performance switch transistor and image sensor application
Eunha Lee , Anass Benayad , Taeho Shin , HyungIk Lee
Scientific Reports 4 ( 1) 4948 -4948
101
2015
Fourier spectrum based extraction of an equivalent trap state density in indium gallium zinc oxide transistors
Bikash Thakur , Sungsik Lee , Arman Ahnood , Sanghun Jeon
Applied Physics Letters 104 ( 20) 203505
1
2014
Gated three-terminal device architecture to eliminate persistent photoconductivity in oxide semiconductor photosensor arrays
Sanghun Jeon , Seung-Eon Ahn , Ihun Song , Chang Jung Kim
Nature Materials 11 ( 4) 301 -305
414
2012
Static electrical characterization and low frequency noise of a-InHfZnO thin film transistors
So Jeong Park , Dae-Young Jeon , Seung-Eon Ahn , Sanghun Jeon
Thin Solid Films 548 560 -565
12
2013
P‐16: Light‐Bias Induced Instability and Persistent Photoconductivity in In‐Zn‐O/Ga‐In‐Zn‐O Thin Film Transistors
Khashayar Ghaffarzadeh , Sungsik Lee , Arokia Nathan , John Robertson
SID Symposium Digest of Technical Papers 42 ( 1) 1154 -1157
17
2011
Transient charge trapping and detrapping properties of a thick SiO2/Al2O3 stack studied by short single pulse Id-Vg
Man Chang , Minseok Jo , Seungjae Jung , Joonmyoung Lee
Applied Physics Letters 94 ( 26) 262107
10
2009
III-V compound semiconductors for mass-produced nano-electronics: theoretical studies on mobility degradation by dislocation.
Ji-Hyun Hur , Sanghun Jeon
Scientific Reports 6 ( 1) 22001 -22001
22
2016