Laser Chemical Vapor Deposition of Thick Oxide Coatings

作者: Takashi Goto , Teiichi Kimura

DOI: 10.4028/WWW.SCIENTIFIC.NET/KEM.317-318.495

关键词: Physical vapor depositionDeposition (phase transition)Electron beam physical vapor depositionPulsed laser depositionIon platingMaterials scienceChemical vapor depositionInorganic chemistryChemical engineeringCombustion chemical vapor depositionThin film

摘要: Thick oxide coatings have wide-ranged applications typically thermal barrier coatings. Although high speed deposition processes, often plasma spray or electron-beam physical vapor deposition, have been employed for these applications, another route has been pursued to improve the performance of coatings. We have proposed laser chemical vapor deposition (LCVD) for high-speed and thick oxide coatings. Conventional CVD can fabricate coatings at deposition rates of several to several 10 μm/h, and conventional LCVD has been mainly focused on thin film coatings and low temperature deposition. In the present LCVD, high-speed deposition rates ranging from 300 to 3000 μm/h have been achieved for several oxide coatings such as yttria stabilized zirconia (YSZ), TiO2, Al2O3 and Y2O3. This paper describes the effect of deposition conditions on the morphology and deposition rates for the preparation of YSZ and TiO2 by LCVD.

参考文章(17)
K. L. Siefering, G. L. Griffin, Growth Kinetics of CVD TiO2: Influence of Carrier Gas Journal of The Electrochemical Society. ,vol. 137, pp. 1206- 1208 ,(1990) , 10.1149/1.2086632
W.F. Chu, V. Leonhard, H. Erdmann, M. Ilgenstein, Thick-film chemical sensors Sensors and Actuators B-chemical. ,vol. 4, pp. 321- 324 ,(1991) , 10.1016/0925-4005(91)80130-C
C. Duty, D. Jean, W.J. Lackey, Laser chemical vapour deposition: materials, modelling, and process control International Materials Reviews. ,vol. 46, pp. 271- 287 ,(2001) , 10.1179/095066001771048727
Rong Tu, Takashi Goto, Preparation of rutile and anatase TiO2 films by MOCVD Materials Science Forum. pp. 1219- 1222 ,(2005) , 10.4028/WWW.SCIENTIFIC.NET/MSF.475-479.1219
Jun-Ying Zhang, Ian W. Boyd, B.J. O'Sullivan, P.K. Hurley, P.V. Kelly, J.-P. Sénateur, Nanocrystalline TiO2 films studied by optical, XRD and FTIR spectroscopy Journal of Non-crystalline Solids. ,vol. 303, pp. 134- 138 ,(2002) , 10.1016/S0022-3093(02)00973-0
Boris Préauchat, Stefan Drawin, Properties of PECVD-deposited thermal barrier coatings Surface & Coatings Technology. ,vol. 142, pp. 835- 842 ,(2001) , 10.1016/S0257-8972(01)01211-7
J‐W. Lee, T. E. Schlesinger, A. K. Stamper, M. Migliuolo, D. W. Greve, D. E. Laughlin, Characterization of yttria-stabilized zirconium oxide buffer layers for high-temperature superconductor thin films Journal of Applied Physics. ,vol. 64, pp. 6502- 6504 ,(1988) , 10.1063/1.342068
D Leinen, A Fernández, JP Espinós, AR González-Elipe, Preparation of TiO2 and Al2O3 thin films by ion-beam induced chemical vapour deposition Vacuum. ,vol. 45, pp. 1043- 1045 ,(1994) , 10.1016/0042-207X(94)90018-3
S. Krumdieck, O. Sbaizero, R. Raj, Unique precursor delivery and control afforded by low-pressure pulsed-CVD process with ultrasonic atomization Journal De Physique Iv. ,vol. 11, pp. 1161- 1168 ,(2001) , 10.1051/JP4:20013146
Hidetoshi Miyazaki, Teiichi Kimura, Takashi Goto, Acceleration of deposition rates in a Chemical vapor deposition process by laser irradiation Japanese Journal of Applied Physics. ,vol. 42, pp. 316- 318 ,(2003) , 10.1143/JJAP.42.L316