作者: Hua Xia Ji , Carmela C Amato-Wierda
DOI: 10.1016/S0257-8972(01)01342-1
关键词: Scanning electron microscope 、 Transmission electron microscopy 、 X-ray photoelectron spectroscopy 、 Analytical chemistry 、 Selected area diffraction 、 Carbon film 、 Chemical vapor deposition 、 Combustion chemical vapor deposition 、 Materials science 、 Thin film 、 Mineralogy
摘要: Abstract TiWC thin films were deposited on stainless steel substrates (440C) by chemical vapor deposition (CVD) in a horizontal hot-wall reactor from TiCl 4 W(CO) 6 CH H 2 Ar gaseous mixture, at 1323 K and pressures ranging 0.13 to 20.00 kPa. The structures of the characterized using X-ray diffraction (XRD). lattice constant shifts that TiC WC 1− x with increasing W concentration films. A morphological analysis was carried out scanning electron microscopy (SEM). It found surface morphology varied total flow. Compositional studies binding characteristics investigated photoelectron spectroscopy (XPS). associated hardness measured nano-indentation ranged 23 32 GPa. transmission (TEM) selected area (SAD) reveal detailed microstructure presence phase.