作者: Shinji Nakagomi , Yoshihiro Kokubun
关键词: Gallium 、 Evaporation (deposition) 、 Thin film 、 Crystallography 、 Electron diffraction 、 Sapphire 、 Crystal 、 Substrate (electronics) 、 Materials science 、 Transmission electron microscopy
摘要: A β‐Ga2O3 thin film was formed on a (0001) c‐plane GaN template substrate by gallium evaporation in an oxygen plasma. From X‐ray diffraction measurements using ω–2θ and ϕ scans, the film orientation was found to be () β‐Ga2O3||(0001) GaN||(0001) sapphire. In addition, the β‐Ga2O3 had a sixfold domain structure in which the (010) planes in each crystal domain were parallel to the {} planes of GaN. This structure was confirmed by cross‐sectional and plan‐view transmission electron microscopy images and selected‐area …