Crystal orientations of β‐Ga2O3 thin films formed on c‐plane GaN substrate

作者: Shinji Nakagomi , Yoshihiro Kokubun

DOI: 10.1002/PSSB.201552794

关键词: GalliumEvaporation (deposition)Thin filmCrystallographyElectron diffractionSapphireCrystalSubstrate (electronics)Materials scienceTransmission electron microscopy

摘要: A β‐Ga2O3 thin film was formed on a (0001) c‐plane GaN template substrate by gallium evaporation in an oxygen plasma. From X‐ray diffraction measurements using ω–2θ and ϕ scans, the film orientation was found to be () β‐Ga2O3||(0001) GaN||(0001) sapphire. In addition, the β‐Ga2O3 had a sixfold domain structure in which the (010) planes in each crystal domain were parallel to the {} planes of GaN. This structure was confirmed by cross‐sectional and plan‐view transmission electron microscopy images and selected‐area …

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