Thermal donors formation via isothermal annealing in magnetic Czochralski high resistivity silicon

作者: Mara Bruzzi , David Menichelli , Monica Scaringella , Jaakko Härkönen , Esa Tuovinen

DOI: 10.1063/1.2192307

关键词: ThermalElectrical resistivity and conductivityBoronDeep-level transient spectroscopySiliconMaterials scienceAnalytical chemistrySpace chargeAnnealing (metallurgy)DopingGeneral Physics and Astronomy

摘要: A quantitative study about the thermal activation of oxygen related donors in high resistivity p-type magnetic Czochralski silicon has been carried out. Thermal donor formation performed through isothermal annealing at 430°C up to a total time 120min. Space charge density after each step measured by transient current technique. The localized energy levels double (TD) have observed and studied details thermally stimulated currents (TSCs) range 10–70K, energies E effective cross sections σ determined for both emissions TD0∕+ (E=75±5meV, σ=4×10−14cm2) TD+∕+ (E=170±5meV, σ=2×10−12cm2). evolution space caused unambiguously TDs means deep level spectroscopy TSC, transients constant temperature i(t,T). Our results show that compensate initial boron doping, eventually pr...

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