作者: A.R. Balu , M. Anbarasi , V.S. Nagarethinam , S. RaviShankar
DOI: 10.1016/J.IJLEO.2015.06.039
关键词: Analytical chemistry 、 Materials science 、 Electrical resistivity and conductivity 、 X-ray crystallography 、 Semiconductor 、 Band gap 、 Orthorhombic crystal system 、 Molar concentration 、 Thin film 、 Substrate (electronics)
摘要: Abstract PbS thin films were deposited onto glass substrates at 400 °C using lead nitrate and thiourea as sources of Pb S respectively. The molar concentration precursor salts (both cationic anionic) was varied 0.025, 0.05, 0.075 0.1 keeping S/Pb ratio equal to 1. structural studies reveal that the S:Pb has a strong influence on microstructural characteristics sprayed films. adherent substrate well crystallized according orthorhombic structure with preferential orientation making transition from (0 0 4) plane (4 1 3) when increases. All have high optical transmittance > 70%. band gap values are found be in range 2.44 – 2.55 eV. refractive index dispersion obeys single oscillator model. Electrical resistivity all order 10 2 Ωcm. fabricated by this simplified technique good structural, electrical properties which desirable for window layers solar cell applications.