作者: K Kaemmer , H Huelz , B Holzapfel , W Haessler , L Schultz
DOI: 10.1088/0022-3727/30/4/004
关键词: Coercivity 、 Optoelectronics 、 Electrode 、 Depletion region 、 Electron diffraction 、 Ferroelectricity 、 Reflection high-energy electron diffraction 、 Materials science 、 Polarization (electrochemistry) 、 Thin film 、 Analytical chemistry
摘要: … parameter and favourable influence on the oxygen defect chemistry. Thin-film stoichiometry … of BTO films on Pt and BTO films on YBCO it follows that the dielectric properties of the BTO …