Thermal sensing scanning probe microscope and method for measurement of thermal parameters of a specimen
作者： Russell J. Pylkki , Marc Schuman , Paul E. West
DOI:
关键词: Optics 、 Signal 、 Composite material 、 Thermal conductivity 、 Scanning probe microscopy 、 Thermal 、 Temperature coefficient 、 Heat transfer 、 Microscope 、 Materials science 、 Cantilever
摘要: The scanning thermal probe microscope measures a parameter such as conductivity or temperature of surface contours specimen with sensor maintained in communication the and at different than that specimen. is disposed on free end cantilever arm probe. A feedback bridge circuit can maintain constant by heating cooling sensor, provides signal for determining heat transfer between includes first second legs electrically conductive material, comprises narrowed portion conducting material having relatively high coefficient resistance.
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