Degradation of Y2SiO5:Ce phosphor powders
作者： E. Coetsee , J.J. Terblans , H.C. Swart
DOI: 10.1016/J.JLUMIN.2006.05.005
关键词: Cathodoluminescence 、 Surface layer 、 X-ray photoelectron spectroscopy 、 Phosphor 、 Materials science 、 Field electron emission 、 Analytical chemistry 、 Impurity 、 Spectroscopy 、 Auger electron spectroscopy
摘要: Abstract The degradation of the cathodoluminescence (CL) intensity cerium-doped yttrium silicate (Y2SiO5:Ce) phosphor powders was investigated for possible application in low voltage field emission displays (FEDs). Auger electron spectroscopy (AES), X-ray photoelectron (XPS) and CL were used to monitor changes surface chemical composition luminous efficiency commercially available Y2SiO5:Ce powders. is consistent with a well-known electron-stimulated reaction (ESSCR) model. It shown XPS that stimulated led formation luminescent silicon dioxide (SiO2) layer on powder. also indicated Ce concentration increased during process CeO2 CeH3 part process. first decreased until about 300 C cm−2 then due an extra peak arising at wavelength 650 nm.
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