Interface dilution and morphology of CdTe/MnTe superlattices studied by small angle X-ray scattering
作者： J. Eymery , J.M. Hartmann , G.T. Baumbach
DOI: 10.1016/S0022-0248(98)80304-7
关键词: Refractive index 、 Microstructure 、 Cadmium telluride photovoltaics 、 Small-angle X-ray scattering 、 Superlattice 、 Optics 、 Surface finish 、 Analytical chemistry 、 Chemistry 、 Born approximation 、 Small-angle scattering
摘要: We have performed small angle X-ray reflectivity measurements on CdTe/MnTe superlattices. The Fresnel optical method and the distorted wave Born approximation were used to extract results from data. shows that interface roughness (about 7 A) is quite large for (43 ML CdTe/8 MnTe) (34 CdTe/16 samples. effective MnTe concentration determined refractive index. A model of correlated profiles successfully simulate diffuse scattering, determine lateral correlation length (Λ| = 1500 ± 750 A); moreover, we demonstrate layers are almost completely over sample thickness in growth direction.
harvard.edu
archives-ouvertes.fr
elsevier.com
sci-hub.se 参考文章(8)
V. Holý, T. Baumbach, Nonspecular x-ray reflection from rough multilayers. Physical Review B. ,vol. 49, pp. 10668- 10676 ,(1994) , 10.1103/PHYSREVB.49.10668
J. M. Hartmann, G. Feuillet, M. Charleux, H. Mariette, Atomic layer epitaxy of CdTe and MnTe Journal of Applied Physics. ,vol. 79, pp. 3035- 3041 ,(1996) , 10.1063/1.361243
J Kossut, W Dobrowolski, Diluted magnetic semiconductors Journal of Applied Physics. ,vol. 64, pp. R29- R64 ,(1988) , 10.1063/1.341700
B. Vidal, P. Vincent, Metallic multilayers for x rays using classical thin-film theory Applied Optics. ,vol. 23, pp. 1794- 1801 ,(1984) , 10.1364/AO.23.001794
S. K. Sinha, E. B. Sirota, S. Garoff, H. B. Stanley, X-ray and neutron scattering from rough surfaces Physical Review B. ,vol. 38, pp. 2297- 2311 ,(1988) , 10.1103/PHYSREVB.38.2297
W. Grieshaber, A. Haury, J. Cibert, Y. Merle d’Aubigné, A. Wasiela, J. A. Gaj, Magneto-optic study of the interface in semimagnetic semiconductor heterostructures: Intrinsic effect and interface profile in CdTe-Cd1-xMnxTe. Physical Review B. ,vol. 53, pp. 4891- 4904 ,(1996) , 10.1103/PHYSREVB.53.4891
L. G. Parratt, Surface Studies of Solids by Total Reflection of X-Rays Physical Review. ,vol. 95, pp. 359- 369 ,(1954) , 10.1103/PHYSREV.95.359
P. H. Jouneau, A. Tardot, G. Feuillet, H. Mariette, J. Cibert, Strain mapping of ultrathin epitaxial ZnTe and MnTe layers embedded in CdTe Journal of Applied Physics. ,vol. 75, pp. 7310- 7316 ,(1994) , 10.1063/1.356641