作者: T.S. Baller , J. Dieleman
DOI: 10.1016/0169-4332(89)90248-1
关键词: Optoelectronics 、 Excimer laser 、 Reactive-ion etching 、 Isotropic etching 、 Etching (microfabrication) 、 Analytical chemistry 、 Copper 、 Silicon 、 Laser 、 Materials science 、 Nanosecond
摘要: Abstract The use of lasers in etching and deposition processes has been studied extensively, especially during the last decade. Progress understanding mechanisms pulsed laser-enhanced chemical is largely recent data. An overview given discussed. Experimental results excimer copper silicon a low-pressure chlorine environment are emphasized. In particular measured detection angle time-of-flight distributions Calculations effects post-desorption collisions between etch products on measurement kinetic energy presented used to explain experimental results. It shown that both laser-driven diffusion into dependence behaviour surface coverage which have be taken account description mechanism.