Microwave operation of submicrometer channel-length Silicon MOSFET's

作者: D.C. Shaver

DOI: 10.1109/EDL.1985.26034

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摘要: Aluminum-gate silicon n-channel MOSFET's with channel lengths down to 0.5 µm have been fabricated. A simple four-mask process based on contact optical lithography was used. Partial self-alignment of the gate could be achieved because an enhanced oxidation rate over source/drain due heavy arsenic implantation. Accordingly, parasitics were minimized and devices showed excellent microwave performance f_{\max} f T near 20 GHz.

参考文章(2)
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G. Fernholz, H. Beneking, Ion implanted Si MESFET's with high cutoff frequency IEEE Transactions on Electron Devices. ,vol. 30, pp. 837- 840 ,(1983) , 10.1109/T-ED.1983.21218