作者: Hong-Wei Yang , C. Robert Kao , Akitsu Shigetou
DOI: 10.1021/ACS.LANGMUIR.7B02010
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摘要: The evolution of surface chemical structures polyimide induced by Ar fast atom beam (Ar-FAB) bombardment and vacuum ultraviolet (VUV) irradiation was investigated using X-ray photoelectron spectroscopy (XPS) to clarify the activated sites for low-temperature hybrid bonding. These in molecular chains are considered corresponding bonding sites. They affect interfacial properties. Therefore, such analyses necessary optimize processing parameters different surface-modification methods. XPS results demonstrated that Ar-FAB physical transformed into benzene-dominant structures, whereas effect VUV located at side chain groups as ether carbonyl, resulting much longer fragments (i.e., less matrix damage). Moreover, calculated thickness VUV-induced modification layer grew around 0.6 nm its maximum.