作者: M. K. Behbehani , E. L. Piner , S. X. Liu , N. A. El-Masry , S. M. Bedair
DOI: 10.1063/1.124964
关键词:
摘要: We have recently reported the occurrence of phase separation in InxGa1−xN samples with x>0.25. Theoretical studies suggested that can phase-separate asymmetrically into a low InN% and an ordered high phase. In this letter, we report on existence simultaneous ordering these samples, was detected by both transmission electron microscopy selected area diffraction (TEM-SAD) x-ray diffraction. Ordering imaging TEM-SAD.