作者: Hoon-Young Kim , Ji-Wook Yoon , Won-Suk Choi , Kwang-Ryul Kim , Sung-Hak Cho
DOI: 10.1016/J.OPTLASENG.2016.03.025
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摘要: Abstract We reported on the ablation depth control with a resolution of 40 nm indium tin oxide (ITO) thin film using square beam shaped femtosecond (190 fs) laser (λp=1030 nm). A slit is used to make square, flat top from Gaussian spatial profile laser. An was obtained single pulse irradiation at peak intensity 2.8 TW/cm2. The morphologies ablated area were characterized an optical microscope, atomic force microscope (AFM), and energy dispersive X-ray spectroscopy (EDS). Ablations rectangular types various sizes demonstrated ITO slits varying x–y axes. stereo structure approximately also fabricated successfully pulses different