Temperature monitoring inside IGBT modules at forward bias from the cross section and its finite element analysis
作者： Yongle Huang , Yifei Luo , Fei Xiao , Binli Liu , None
DOI: 10.1016/J.MICROREL.2018.03.008
关键词:
摘要: … in epoxy resin. However, thermal behavior and temperature distribution inside the whole IGBT modules at the switching-on or steady conduction state had not been discussed. …
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sci-hub.se 参考文章(35)
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