作者: H. Goronkin , S. Tehrani , T. Remmel , P.L. Fejes , K.J. Johnston
DOI: 10.1109/16.19927
关键词:
摘要: Hypoeutectic AuGe/Ni ohmic contacts on GaAs and GaAs/AlGaAs were characterized by SEM, TEM, energy dispersive X-ray analysis. The two main components of the contact confirmed to be NiGeAs islands distributed in an Au-Ga alloy. larger more evenly MESFETs than MODFETs. Vertical penetration was impeded but not halted AlGaAs. Since did melt during alloying cycle, there no lateral encroachment observed. >