Optical properties of polycrystalline AgxGa2−xSe2 (0.4⩽x⩽1.6) thin films

作者: M.R.A. Bhuiyan , S.M. Firoz Hasan

DOI: 10.1016/J.SOLMAT.2006.07.010

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摘要: Abstract Polycrystalline thin films of Ag x Ga 2− Se 2 (0.4⩽ ⩽1.6) were prepared onto cleaned glass substrates by the stacked elemental layer (SEL) deposition technique. All annealed in situ at 300 °C for 15 min. The compositions measured energy-dispersive analysis X-ray (EDAX) method. structural and optical properties ascertained diffraction (XRD) UV–VIS–NIR spectrophotometry (photon wavelength ranging from 300 to 2500 nm), respectively. influence composition on material has been investigated. Microstructural perfection is quite evident abrupt descent around specific energy photons transmittance spectra. Stoichiometric or slightly silver-deficient show optimum electron transition minimum sub-band gap absorption.

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