Atomic Force Microscopy of Removal of Dentin Smear Layers

作者: Luiz Henrique Carvalho Batista , José Ginaldo da Silva Júnior , Milton Fernando Andrade Silva , Josealdo Tonholo , None

DOI: 10.1017/S1431927607070419

关键词:

摘要: The regular periodontal practice of scaling and root planing produces a smear layer on the surface that is detrimental to readhesion tissues during subsequent regeneration therapy. Although it has been demonstrated gels containing chelating agent ethylenediaminetetraacetic acid (EDTA) can assist in removal this contaminating layer, no quantitative method yet available by which evaluate efficiency treatment. In article, power atomic force microscopy (AFM) as technique for monitoring mapping surfaces dentinal roots demonstrated. Roughness parameters teeth had scaled planed were determined from AFM images acquired both before after treatment with EDTA. results confirmed EDTA an efficient cleaning samples free are significantly rougher than same covered layer. analysis superior alternative methods involving scanning electron because sample section be analyzed many times, thus permitting used control surface.

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