作者: Thomas H. Baum , Bryan C. Hendrix , Tianniu Chen , Jeffery F. Roeder , Chongying Xu
DOI:
关键词:
摘要: Silicon precursors for forming silicon-containing films in the manufacture of semiconductor devices, such as including silicon carbonitride, oxycarbonitride, and nitride (Si3N4), a method depositing on substrates using low temperature (e.g., < 550 °C) chemical vapor deposition processes, fabrication ULSI devices device structures.