Scanning force microscope with removable probe illuminator assembly
作者： David J. Ray
DOI:
关键词: Laser 、 Microscope 、 Optics 、 Laser beams 、 Materials science 、 Scanning Force Microscope 、 Cantilever
摘要: A scanning force microscope employs a laser (76) which creates beam (26). The and probe assembly (24) are mounted in removable illuminator (22). illumination is to the moving portion of mechanism. mechanism relative movement between sample (28). removal permits alignment said onto cantilever (30) after from microscope. This prevents damage to, shortens time of, during replacement assembly.
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