作者: M. Benamara , L. Kirste , M. Albrecht , K. W. Benz , H. P. Strunk
DOI: 10.1063/1.1541093
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摘要: This letter reports the identification of long-range ordering in AlGaN compounds along pyramidal planes by transmission electron microscopy. consists alternate stacking GaN and AlN layers on {1101} is evidenced comparison experimental diffraction patterns [0110] [1120] with calculated patterns. A formation model this presented. It based upon Ga incorporation reduced-N coordination sites that are located at step edges pit facets.