Low dielectric constant material and method of processing by CVD

作者: Brian Keith Peterson , Raymond Nicholas Vrtis , Jean Louise Vincent , Mark Leonard O'neill

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摘要: Organofluorosilicate glass films contain both organic species and inorganic fluorines, exclusive of significant amounts fluorocarbon species. Preferred are represented by the formula Si v O w C x H y F z , where v+w+x+y+z=100%, is from 10 to 35 atomic %, 65 % 50 1 30 0.1 15 x/z optionally greater than 0.25, wherein substantially none fluorine bonded carbon. A CVD method includes: (a) providing a substrate within vacuum chamber; (b) introducing into chamber gaseous reagents including fluorine-providing gas, an oxygen-providing gas at least one precursor selected organosilane organosiloxane; (c) applying energy in induce reaction form film on substrate.

参考文章(48)
Tatsuru Shirafuji, Yasuo Miyazaki, Yasuaki Hayashi, Shigehiro Nishino, PE-CVD of Fluorocarbon/SiO Composite Thin Films Using C4F8 and HMDSO Plasmas and Polymers. ,vol. 4, pp. 57- 75 ,(1999) , 10.1023/A:1021803615715
Melvin C. Schmidt, Glenn L. Nobinger, Lingqian Qian, Method of forming a fluorinated silicon oxide layer using plasma chemical vapor deposition ,(1996)
Chin-Kai Liu, Wen-Teng Wu, Pi-Chen Shieh, Ruey-Yun Shiue, Method of forming bond pad structure for the via plug process ,(1996)
Douglas R. Sparks, Plasma Etching of Si, SiO2, Si3 N 4, and Resist with Fluorine, Chlorine, and Bromine Compounds Journal of The Electrochemical Society. ,vol. 139, pp. 1736- 1741 ,(1992) , 10.1149/1.2069485
Rempei Nakata, Haruo Okano, Nobuo Hayasaka, Takahito Nagamatsu, Hitoshi Ito, Akemi Satoh, Masao Toyosaki, Yukio Nishiyama, Riichirou Aoki, Method of manufacturing silicon oxide film containing fluorine ,(1993)