作者: M. Mita , H. Kawara , H. Toshiyoshi , J. Endo , H. Fujita
DOI: 10.1109/JMEMS.2004.838997
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摘要: We have successfully developed an integrated micromechanical system for controlling tunneling current. A pair of nanoscale tips been with a silicon micromachined electrostatic actuator high-aspect ratio. The tip sharpness has observed to be as sharp commercial by scanning over surface carbon graphite atom scale. also succeeded observe the current in air and vacuum condition (in TEM).