Insulator/Semiconductor Interfaces

作者: Carl W. Wilmsen

DOI: 10.1007/978-1-4899-2382-0_5

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摘要: Often the insulator-semiconductor interface is modelled as an abrupt change from a crystalline semiconductor to amorphorous insulator. For some applications this idealized model satisfactory but for others it leads incorrect results. Realistic modeling of requires understanding chemical and structural properties how was formed. In series lectures, these will be discussed Si/SiO2, InP GaAs/native oxide InP/deposited insulator interfaces. These interfaces are both technologically important typical wide variety possible couples.

参考文章(37)
D.T. Clark, T. Fok, Surface modification of InP by plasma techniques using hydrogen and oxygen Thin Solid Films. ,vol. 78, pp. 271- 278 ,(1981) , 10.1016/0040-6090(89)90593-2
W.Y. Lum, G.E. McWilliams, A.R. Clawson, Control of substrate degradation IN InP LPE growth with PH3 partial pressure Journal of Crystal Growth. ,vol. 46, pp. 300- 303 ,(1979) , 10.1016/0022-0248(79)90075-7
B. T. Moore, D. K. Ferry, SCATTERING OF INVERSION LAYER ELECTRONS BY OXIDE POLAR MODE GENERATED INTERFACE PHONONS. Journal of Vacuum Science and Technology. ,vol. 17, pp. 1037- 1040 ,(1980) , 10.1116/1.570586
C.W Wilmsen, J.F Wager, K.M Geib, T Hwang, M Fathipour, Traps at the deposited insulator-InP interface— a discussion of a possible cause Thin Solid Films. ,vol. 103, pp. 47- 52 ,(1983) , 10.1016/0040-6090(83)90423-6
J. Woodward, D.C. Cameron, L.D. Irving, G.R. Jones, The deposition of insulators onto InP using plasma-enhanced chemical vapour deposition Thin Solid Films. ,vol. 85, pp. 61- 69 ,(1981) , 10.1016/0040-6090(81)90055-9
J. S. Johannessen, W. E. Spicer, Y. E. Strausser, An Auger analysis of the SiO2‐Si interface Journal of Applied Physics. ,vol. 47, pp. 3028- 3037 ,(1976) , 10.1063/1.323047
J.F. Wager, W.H. Makky, C.W. Wilmsen, L.G. Meiners, Oxidation of InP in a plasma-enhanced chemical vapor deposition reactor Thin Solid Films. ,vol. 95, pp. 343- 350 ,(1982) , 10.1016/0040-6090(82)90040-2
Edward H. Poindexter, Philip J. Caplan, Bruce E. Deal, Reda R. Razouk, Interface states and electron spin resonance centers in thermally oxidized (111) and (100) silicon wafers Journal of Applied Physics. ,vol. 52, pp. 879- 884 ,(1981) , 10.1063/1.328771
H. Koelmans, H.C. De Graaff, Drift phenomena in CdSe thin film FET's Solid-state Electronics. ,vol. 10, pp. 997- 1005 ,(1967) , 10.1016/0038-1101(67)90149-9
C.W. Wilmsen, R.W. Kee, J.F. Wager, J. Stannard, L. Messick, Interface formation of deposited insulator layers on GaAs and InP Thin Solid Films. ,vol. 64, pp. 49- 55 ,(1979) , 10.1016/0040-6090(79)90542-X