Moinuddin Ahmed , Christopher Stankus , Angel Yanguas-Gil , John Hryn
radiation effects data workshop
Moinuddin Ahmed , Donald P. Butler , Zeynep-Celik Butler
ieee sensors 460 -463
Christopher Stankus , Moinuddin Ahmed ,
Solid-state Electronics 164 107744
Moinuddin Ahmed , Murali M. Chitteboyina , Donald P. Butler , Zeynep Celik-Butler
IEEE Sensors Journal 13 ( 10) 4081 -4089
Moinuddin Ahmed , Murali M. Chitteboyina , Donald P. Butler , Zeynep Celik-Butler
IEEE Sensors Journal 12 ( 5) 864 -869
Moinuddin Ahmed , Ismail Erkin Gonenli , Gaviraj S. Nadvi , Rohit Kilaru
ieee sensors 1 -4
Moinuddin Ahmed , Donald P. Butler , Zeynep Celik-Butler
ieee sensors 2155 -2158
Moinuddin Ahmed , Donald P. Butler , Mukti M. Rana , Noureddine Melikechi
2012 International Conference on Optical MEMS and Nanophotonics 99 -100
Moinuddin Ahmed , Donald P. Butler
Infrared Physics & Technology 71 1 -9
Moinuddin Ahmed , Donald P. Butler , Zeynep Celik-Butler
Infrared Physics & Technology 79 50 -57
Moinuddin Ahmed , Donald P. Butler
Microsystem Technologies-micro-and Nanosystems-information Storage and Processing Systems 22 ( 2) 367 -370
Moinuddin Ahmed , Donald P. Butler
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 31 ( 5) 050602
Pete Beckman , Charlie Catlett , Moinuddin Ahmed , Mohammed Alawad
Office of Scientific and Technical Information (OSTI)
Moinuddin Ahmed , Bahadir Kucukgok , Angel Yanguas-Gil , John Hryn
SN Applied Sciences 1 ( 7) 1 -5
Moinuddin Ahmed , Donald P. Butler
IEEE Sensors Journal 15 ( 12) 6986 -6994
Moinuddin Ahmed , Murali Chitteboyina , Donald P. Butler , Zeynep Celik-Butler
IEEE\/ASME Journal of Microelectromechanical Systems 24 ( 5) 1400 -1408
Moinuddin Ahmed , Donald P. Butler , Zeynep Celik-Butler
international conference on noise and fluctuations 154 -157
Moinuddin Ahmed , Donald P. Butler , Zeynep Celik-Butler
2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS) 575 -578
Jieru Zhao , Wen Dong , Thomas Hinds , Yuqi Li
IEEE Sensors Journal
Carlos Olivares , Raziur Rahman , Christopher Stankus , Jade Hampton
arXiv preprint arXiv:2107.10292