Semiconductor image sensor

作者: Clifford I. Drowley , Mark S. Swenson , Shrinath Ramaswami , Jennifer J. Patterson

DOI:

关键词: TransistorCharge carrierOpticsLayer (electronics)Image sensorMaterials scienceSemiconductorImage sensing

摘要: An image sensor (10) has an sensing element that includes N-type conducting region (26) and a P-type pinned layer (37). The two regions form P-N junctions at different depths increase the efficiency of charge carrier collection frequencies light. is formed by angle implant ensures portion can function as source MOS transistor (32).

参考文章(21)
Hiromitsu Shiraki, Nobukazu Teranishi, Yasuo Ishihara, Solid-state imaging device having a reduced image lag ,(1981)
B.C. Burkey, W.C. Chang, J. Littlehale, T.H. Lee, T.J. Tredwell, J.P. Lavine, E.A. Trabka, The pinned photodiode for an interline-transfer CCD image sensor international electron devices meeting. ,vol. 30, pp. 28- 31 ,(1984) , 10.1109/IEDM.1984.190633
Robert M. Guidash, Paul P. Lee, Teh-Hsuang Lee, Eric Gordon Stevens, Active pixel sensor integrated with a pinned photodiode ,(1996)
Mototaka Kamoshida, Tomomitsu Satake, Sokichi Yamagishi, Sadayuki Kishi, Takashi Okada, Method of making an ohmic contact with a semiconductor substrate ,(1973)
Tee Suan Rii, Eritsuku Goodon Suteiibunsu, Pooru Pii Rii, Robaato Emu Gaidatsushiyu, PIN LIGHT BEAM DIODE INTEGRATED ACTIVE PICTURE ELEMENT SENSOR ,(1996)
Morishima Hiroshi, TENSION CONTROLLER FOR PAPER MACHINE ,(1992)
Kiyoshi Tanaka, Akio Hayasaka, Manufacture of multilayer interconnection material ,(1987)