STEM-EDX tomography of bimetallic nanoparticles: A methodological investigation.
作者： Thomas J.A. Slater , Arne Janssen , Pedro H.C. Camargo , M. Grace Burke , Nestor J. Zaluzec
DOI: 10.1016/J.ULTRAMIC.2015.10.007
关键词: Electron tomography 、 Energy-dispersive X-ray spectroscopy 、 Field of view 、 Tilt (optics) 、 Detector 、 Scanning transmission electron microscopy 、 Absorption (electromagnetic radiation) 、 Optics 、 Tomography 、 Materials science
摘要: … We have acquired EDX spectrum images every 10 using variable tilt-dependent acquisition times as shown in Fig. 8a. The Au Lα, Au Mα and Ag Lα specimen X-ray counts displayed far …
core.ac.uk
osti.gov
manchester.ac.uk参考文章(32)
L. CERVERA GONTARD, R.E. DUNIN-BORKOWSKI, D. OZKAYA, Three-dimensional shapes and spatial distributions of Pt and PtCr catalyst nanoparticles on carbon black. Journal of Microscopy. ,vol. 232, pp. 248- 259 ,(2008) , 10.1111/J.1365-2818.2008.02096.X
P. Schlossmacher, D.O. Klenov, B. Freitag, H.S. von Harrach, Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology Microscopy Today. ,vol. 18, pp. 14- 20 ,(2010) , 10.1017/S1551929510000404
P. B. Hirsch, A. Howie, M. J. Whelan, On the production of X-rays in thin metal foils Philosophical Magazine. ,vol. 7, pp. 2095- 2100 ,(1962) , 10.1080/14786436208214478
S. Sueda, K. Yoshida, N. Tanaka, Quantification of metallic nanoparticle morphology on TiO2 using HAADF-STEM tomography. Ultramicroscopy. ,vol. 110, pp. 1120- 1127 ,(2010) , 10.1016/J.ULTRAMIC.2010.04.003
Patrick J. Phillips, Tadas Paulauskas, Neil Rowlands, Alan W. Nicholls, Ke-Bin Low, Santokh Bhadare, Robert F. Klie, A new silicon drift detector for high spatial resolution STEM-XEDS: performance and applications. Microscopy and Microanalysis. ,vol. 20, pp. 1046- 1052 ,(2014) , 10.1017/S1431927614001639
B. Goris, T. Roelandts, K.J. Batenburg, H. Heidari Mezerji, S. Bals, Advanced reconstruction algorithms for electron tomography : from comparison to combination Ultramicroscopy. ,vol. 127, pp. 40- 47 ,(2013) , 10.1016/J.ULTRAMIC.2012.07.003
John Meurig Thomas, Paul A. Midgley, Timothy J. V. Yates, Jonathan S. Barnard, Robert Raja, Ilke Arslan, Matthew Weyland, The Chemical Application of High‐Resolution Electron Tomography: Bright Field or Dark Field? Angewandte Chemie. ,vol. 43, pp. 6745- 6747 ,(2004) , 10.1002/ANIE.200461453
Arda Genc, Libor Kovarik, Meng Gu, Huikai Cheng, Paul Plachinda, Lee Pullan, Bert Freitag, Chongmin Wang, XEDS STEM tomography for 3D chemical characterization of nanoscale particles. Ultramicroscopy. ,vol. 131, pp. 24- 32 ,(2013) , 10.1016/J.ULTRAMIC.2013.03.023
Paul A. Midgley, Rafal E. Dunin-Borkowski, Electron tomography and holography in materials science Nature Materials. ,vol. 8, pp. 271- 280 ,(2009) , 10.1038/NMAT2406
Nestor J. Zaluzec, Innovative Instrumentation for Analysis of Nanoparticles: The π Steradian Detector Microscopy Today. ,vol. 17, pp. 56- 59 ,(2009) , 10.1017/S1551929509000224