In‐plane alignment ofa‐axis oriented YBa2Cu3Oxthin films
作者： Masashi Mukaida , Shintaro Miyazawa
DOI: 10.1063/1.109819
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摘要: The in‐plane orientation of a‐axis oriented YBa2Cu3Ox thin films on SrLaGaO4 (100) substrates is studied by φ‐scan (in‐plane rotation) x‐ray diffraction, reflection high energy electron and planar‐view transmission microscopy measurements. It revealed that the exhibit a twofold symmetry, indicating independent b‐ c‐axis orientations in surface plane. There are no 90° domains, aligned to [001] direction substrate azimuth. resistivity at 290 K 5.5 mΩ cm, about eleven times larger than direction. temperature differential normalized resistivity, d[R(T)/R(300)]/dT, (1.1×10−3 K−1) smaller b‐axis (2.8×10−3 K−1).
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