Structural, optical and electrical properties of ZnO thin films grown by radio frequency (rf) sputtering in oxygen atmosphere

作者: Juan M. Camacho , E. Chan y Diaz , P. Sanchez Santiago , A. Iribarren , R. Castro-Rodriguez

DOI: 10.5897/IJPS11.898

关键词: Electrical resistivity and conductivityThin filmSputteringOptoelectronicsLayer (electronics)Materials scienceElectrical resistance and conductanceOxideCadmium telluride photovoltaicsSolar cell

摘要: Growth conditions for ZnO thin films were found their potential use as a buffer layer in CdTe/CdS solar cells. Electrical, optical and structural properties investigated function of the oxygen pressure during growth by radio frequency (rf) sputtering. The electrical behavior is explained terms properties. Our results suggest that optimal partial 4 Pa attaining film layer, with resistivity on order 103 W cm an average transmission 89%.   Key words: Zinc oxide, transparent conducting cell, resistance, transmission.

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