An Accurate Statistical Yield Model for CMOS Current-Steering D/A Converters
作者： Anne van den Bosch , Michiel Steyaert , Willy Sansen
关键词: Linearity 、 Transistor 、 Current source 、 Computer science 、 Monte Carlo method 、 Moment (mathematics) 、 Electronic engineering 、 Converters 、 Matching (statistics) 、 CMOS
摘要: To obtain a high resolution CMOS current-steering digital-to-analog converter, the matching behavior of current source transistors is one key issues in design. At this moment, these properties are taken into account by use time consuming and CPU intensive Monte Carlo simulations. In paper, formula derived that describes accurately impact mismatch on INL (integral non-linearity) yield D/A converters without any loss design time.
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